ATOMIC FORCE MICROSCOPE SICM MODULE
The AFM has been applied to problems in a wide range of disciplines of the natural sciences, including solid-state physics, semiconductor science and technology, molecular engineering, polymer chemistry and physics, surface chemistry, molecular biology, cell biology, and medicine.
The integration of the SICM and AFM system allows researchers to expand the depth of their research and easily perform nanoscale imaging in aqueous environments.
- SICM Standard Imaging
- DC (direct current) mode, ARS (apporach-retract-scan) mode
- SICM Ionic Current Measurement
×